Title:
PROBE SOCKET
Document Type and Number:
WIPO Patent Application WO/2018/194276
Kind Code:
A1
Abstract:
Disclosed is a probe socket for inspecting electric characteristics of an object to be tested. The probe socket includes a plurality of power pins for applying power to the object to be tested, a plurality of ground pins arranged in parallel with the power pins, a support block for accommodating and supporting the plurality of power pins or ground pins in parallel, and a conductive plate arranged inside the support block in a direction transverse to lengthwise directions of the power pin and the ground pin and having at least one of a power connection pattern for electrically connecting the plurality of power pins in common and a ground connection pattern for electrically connecting the plurality of ground pins in common.
Inventors:
JEONG JAE-HWAN (KR)
Application Number:
PCT/KR2018/003270
Publication Date:
October 25, 2018
Filing Date:
March 22, 2018
Export Citation:
Assignee:
LEENO IND INC (KR)
International Classes:
G01R1/04; G01R1/067; G01R1/073; G01R31/28
Foreign References:
| KR20140003743A | 2014-01-10 | |||
| KR101095907B1 | 2011-12-21 | |||
| KR101254180B1 | 2013-04-18 | |||
| US20050035754A1 | 2005-02-17 | |||
| KR20060052285A | 2006-05-19 |
Attorney, Agent or Firm:
HUH, Sung-Won et al. (KR)
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