Title:
PROBE FOR TESTING DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/093109
Kind Code:
A2
Abstract:
Disclosed is a probe for testing an electric characteristic of an object to be tested. The probe includes a core with conductive properties and shaped like a bar; and an elastic plating layer made of a material having higher elasticity than the core and plated on an outer surface of the core. The probe according to the present disclosure is not only excellent in contact with the object to be tested and durability but also has low resistance, and makes it easy to manufacture a probe supporter for supporting the probe.
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Inventors:
JEONG JAE-HWAN (KR)
Application Number:
PCT/KR2017/012845
Publication Date:
May 24, 2018
Filing Date:
November 15, 2017
Export Citation:
Assignee:
LEENO IND INC (KR)
International Classes:
G01R1/067; G01R1/073; G01R31/28
Attorney, Agent or Firm:
HUH, Sung-Won et al. (KR)
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