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Patent Searching and Data


Title:
PROCESS FOR PRODUCING INSULATING FILM
Document Type and Number:
WIPO Patent Application WO/1999/028961
Kind Code:
A1
Abstract:
A process for producing insulating films while obviating the problem accompanying the use of a fluorocarbon film as an interlaminar insulating film for semiconductor devices such that the film is heated to, e.g., around 400 to 450 °C upon formation of a tungsten wiring and the heated film not only releases fluorine gas to cause wiring corrosion but also poses various troubles due to the resultant decrease in film thickness. The process comprises converting a fluorocarbon gas and a hydrocarbon gas as the film-forming gas into a plasma to deposit a fluorocarbon film on a semiconductor wafer by means of the resultant active species and subsequently annealing the coated wafer, before wiring formation, in N¿2?, H¿2?, or F¿2? gas as a treatment gas flowing at a rate of 50 sccm to 1 slm and a pressure of 0.1 Pa to 1 MPa (0.1 Pa to 100 kPa for H¿2? gas), e.g., at 425 °C for 10 minutes to 2 hours to cause the fluorocarbon film to release F, CF, CF¿2?, CF¿3?, etc. and to cause the resultant free bonds to link to each other to thereby improve thermal stability.

Inventors:
ISHIZUKA SHUICHI (JP)
Application Number:
PCT/JP1998/005217
Publication Date:
June 10, 1999
Filing Date:
November 19, 1998
Export Citation:
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Assignee:
TOKYO ELECTRON LTD (JP)
ISHIZUKA SHUICHI (JP)
International Classes:
B05D3/02; B05D7/24; C23C16/50; G01Q30/08; H01L21/31; H01L21/3105; H01L21/312; H01L21/314; G01Q80/00; (IPC1-7): H01L21/314; H01L21/768
Foreign References:
JPH08236517A1996-09-13
JPS63192867A1988-08-10
JPS62128630U1987-08-14
JPH06333916A1994-12-02
Other References:
See also references of EP 1039522A4
Attorney, Agent or Firm:
Sato, Kazuo (Room 323 2-3, Marunouchi 3-chome Chiyoda-ku Tokyo, JP)
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