PROCESSING DEVICE

WIPO Patent Application WO/2020/090034

A1

Provided is a processing device which is highly safe and which can detect abnormalities. For example, provided is a processing device which can detect abnormalities even if a common cause failure occurs, and which can also detect abnormalities while eliminating the possibility of loss of safety functionality due to single point failure. The processing device according to the present invention is provided with processing circuits (100) which each comprise a plurality of multiplexed systems having the same function. Each processing circuit (100) is provided with an output signal comparison unit (111) which compares the output signals of the processing circuits (100) with each other. As a result of this configuration, if an abnormality occurs in a processing circuit (100), the processing circuit (100) outputs an output signal different from the output signals of the other processing circuits (100), and each output signal comparison unit (111) can detect the abnormality by comparing output signals. Further, the output signal comparison units (111) are multiplexed, making it possible to eliminate the possibility of loss of safety functionality due to single point failure in an output signal comparison unit (111).

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TAKAHASHI TOMOKAZU (JP)
IMAZAWA TAKAO (JP)
YAMAMOTO KEISUKE (JP)
SHIRAISHI MASAHIRO (JP)

PCT/JP2018/040516

May 07, 2020

October 31, 2018

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HITACHI LTD (JP)

G05B9/03

JP2018072967A	2018-05-10
JP2018101241A	2018-06-28
JP2017103677A	2017-06-08
JP2013083514A	2013-05-09
JPH0267973A	1990-03-07

ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)

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