PROCESSING SURFACE EVALUATION DEVICE, PROCESSING SURFACE EVALUATION SYSTEM, AND PROCESSING SURFACE EVALUATION METHOD

WIPO Patent Application WO/2024/069932

A1

The present invention can estimate the respective priorities of a plurality of evaluation items forming an overall evaluation and interpret the overall evaluation.　This processing surface evaluation device is provided with: an evaluation data / evaluation value acquisition unit that acquires evaluation values of a plurality of evaluation items and a plurality of pieces of evaluation data for a processing surface; an estimation question generation unit that, on the basis of the plurality of pieces of evaluation data and the evaluation values of the plurality of evaluation items, generates estimation questions for estimating the respective priorities of the plurality of evaluation items; an estimation question response acquisition unit that acquires responses for the estimation questions; and a priority analysis output unit that analyzes the responses and estimates and outputs the priorities of the plurality of evaluation items.

ZHAO WEI (JP)
AIZAWA NOBUAKI (JP)
TAN JETHRO ELIEZER TANUWIJAYA (JP)
SATO MOTOKI (JP)
IWASHITA SUMIHISA (JP)
KAWAAI KEIGO (JP)

PCT/JP2022/036711

April 04, 2024

September 30, 2022

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FANUC CORP (JP)

B23Q17/20; B23Q17/24; G01N21/93; G05B19/18

WO2018147236A1	2018-08-16
WO2016125797A1	2016-08-11
WO2014155727A1	2014-10-02

US20170323218A1	2017-11-09
JP2018181218A	2018-11-15
JP2017100603A	2017-06-08
JP2019040586A	2019-03-14
JP2001242086A	2001-09-07
JP2018128993A	2018-08-16

SHOBAYASHI Masayuki et al. (JP)

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