PROCESSOR SYSTEM AND FAILURE DIAGNOSIS METHOD

WIPO Patent Application WO/2024/004351

A1

In the present invention, a failure diagnosis at a higher accuracy can be realized by obtaining, on the basis of knowledge across a plurality of fields, highly comprehensive explicit knowledge which is applicable to the failure diagnosis.　This processor system has at least one processor and at least one memory resource. The memory resource stores therein: a diagnosis program for diagnosing an electronic system including a mobile body or a facility; and a plurality of knowledge graphs that are used for the diagnosis program and that include at least a first knowledge graph and a second knowledge graph created on the basis of domain knowledge different from that of the first knowledge graph. By executing the diagnosis program, the processor: (1) evaluates a semantic similarity between a first knowledge item included in the first knowledge graph and a second knowledge item included in the second knowledge graph; and (2) generates, when the similarity satisfies a prescribed condition, an integrated graph obtained by integrating the first knowledge graph and the second knowledge graph.

NISHINO SHUICHI (JP)
UEMATSU YUTAKA (JP)
TOBA TADANOBU (JP)
SHIMBO KENICHI (JP)
UEZONO TAKUMI (JP)

PCT/JP2023/015715

January 04, 2024

April 20, 2023

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HITACHI LTD (JP)

G06N5/022; G05B23/02; G06F11/22; G06F16/90; G06N20/00

US20220075948A1	2022-03-10
JP2020160867A	2020-10-01
JP2020160868A	2020-10-01
JP2021087222A	2021-06-03
JP2022065502A	2022-04-27

SHOYO INTELLECTUAL PROPERTY FIRM (JP)

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