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Patent Searching and Data


Title:
PROJECTION DEVICE, PROJECTION SYSTEM, AND CALIBRATION METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2017/107969
Kind Code:
A1
Abstract:
Provided are a projection device (1), a projection system, and a calibration method therefor, comprising: a beam generator (10) for emitting a first beam (a1), a second beam (a2), and a third beam (a3), wherein projection lines formed by projecting the first beam (a1), the second beam (a2), and the third beam (a3) onto a rectangular screen (2) having a preset size and in a preset relative position with respect to the projection device (1) overlap any three sides of the rectangular screen (2). Accordingly, a user can adjust projection positions of the first beam (a1), the second beam (a2), and the third beam (a3) to make the projection lines formed by projecting the first beam (a1), the second beam (a2), and the third beam (a3) onto the rectangular screen (2) overlap any three sides of the rectangular screen (2), so that relative positions of the projection device (1) and the rectangular screen (2) are preset relative positions, namely initial installation positions arranged by a professional technician, thereby solving a problem in which a user cannot view a projected image properly due to a change in the relative positions of the projection device (1) and the screen (2).

Inventors:
DENG GAOFEI (CN)
LIN WEI (CN)
LI YI (CN)
Application Number:
PCT/CN2016/111680
Publication Date:
June 29, 2017
Filing Date:
December 23, 2016
Export Citation:
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Assignee:
APPOTRONICS CHINA CORP (CN)
International Classes:
G03B21/14
Foreign References:
JP2014224841A2014-12-04
US20080259288A12008-10-23
CN103096007A2013-05-08
CN201369800Y2009-12-23
CN104460197A2015-03-25
CN104535051A2015-04-22
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