PROJECTION DEVICE AND THREE-DIMENSIONAL MEASUREMENT DEVICE

WIPO Patent Application WO/2019/077797

A1

Provided are a projection device and a three-dimensional measurement device that are able to achieve measurement accuracy improvement and the like when three-dimensional measurement using a pattern projection method is performed. In the present invention, a board inspection apparatus is provided with a projection device 14 that projects a stripe pattern onto a printed board, and a camera that captures an image of the printed board. The projection device 14 has a pattern generation unit 18 that converts light from a light source 17 to a stripe pattern, and a projection lens unit 19 that forms an image of the generated stripe pattern on the printed board. The pattern generation unit 18 comprises: a lattice plate 21 that converts incident light to a stripe pattern; an incident angle adjustment plate 22 that is disposed on the incident surface side of the lattice plate 21 such that an incident angle of the incident light is 0°; and a refraction angle adjustment plate 23 that is disposed on the emission surface side of the lattice plate 21 such that a refraction angle of emitted light is 0°, wherein these are composed of the same optical material having the same refractive index.

FUTAMURA IKUO (JP)
OHYAMA TSUYOSHI (JP)
SAKAIDA NORIHIKO (JP)

PCT/JP2018/022042

April 25, 2019

June 08, 2018

Click for automatic bibliography generation  

CKD CORP (JP)

G01B11/25

JP2009038359A	2009-02-19
JPH0697045A	1994-04-08

YOSHIZAWA, TORU ET AL.: "Compact camera system for 3D profile measurement", PROCEEDINGS SPIE 7513, 2009 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY, vol. 7513, 2009, pages 751304-1 - 751304-8, XP055598202

KAWAGUCHI Mitsuo (JP)

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