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Title:
PROJECTION IMAGING SYSTEM, MEASUREMENT DEVICE, AND PROJECTION IMAGING METHOD
Document Type and Number:
WIPO Patent Application WO/2019/012884
Kind Code:
A1
Abstract:
In the present invention, a projection device (11) projects a plurality of types of pattern images such that the images are switched in each projection frame. An imaging device (12) images an object (2) that the pattern images are projected onto and generates image data. The measurement device (13) determines whether each imaging frame is a key frame of image data arrived at by imaging a single pattern image or a blend frame of image data arrived at by imaging a plurality of pattern images switched during the exposure period for a single frame, and at least uses the image data of the key frames to carry out measurement using a spatial coding method.

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Inventors:
NAKAMURA HIDEYUKI
FUCHIKAMI RYUJI
Application Number:
PCT/JP2018/022140
Publication Date:
January 17, 2019
Filing Date:
June 11, 2018
Export Citation:
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Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
G01B11/25; G06T7/521; H04N5/238; H04N5/74
Domestic Patent References:
WO2017060993A12017-04-13
Foreign References:
JP2013124941A2013-06-24
JP2002131031A2002-05-09
US20090238449A12009-09-24
JP2004289613A2004-10-14
JP2014032159A2014-02-20
Other References:
See also references of EP 3637046A4
Attorney, Agent or Firm:
KAMATA Kenji et al. (JP)
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