Title:
PUNCH HEIGHT MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/166546
Kind Code:
A1
Abstract:
A punch height measurement device (10) is provided with a support block (12) having a support surface (12f) for supporting an attachment reference surface (Pf) of a punching die (P), and a pressing member (14) for holding the proximal-end part of the punching die (P) cooperatively with the support block (12). A measuring instrument (40) is provided for measuring the distance from the support surface (12f) of the support block (12) to the distal end (Pt) of the punching die (P) in a state in which the attachment reference surface of the punching die (P) is supported in a position facing the support surface (12f) of the support block (12).
Inventors:
HAYASHI SHIRO (JP)
MIYASHITA NOBUHITO (JP)
MIYASHITA NOBUHITO (JP)
Application Number:
PCT/JP2020/005049
Publication Date:
August 20, 2020
Filing Date:
February 10, 2020
Export Citation:
Assignee:
AMADA HOLDINGS COLTD (JP)
International Classes:
B21D5/02; B23Q17/00
Foreign References:
| JPS60142038U | 1985-09-20 | |||
| JP2018505061A | 2018-02-22 | |||
| JP2004237323A | 2004-08-26 | |||
| JPS5425583U | 1979-02-20 | |||
| JPS57122343U | 1982-07-30 |
Attorney, Agent or Firm:
MIYOSHI Hidekazu et al. (JP)
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