Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
QUALITY ANALYSIS DEVICE AND QUALITY ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2019/016892
Kind Code:
A1
Abstract:
According to the present invention, a data aggregation unit (1) acquires quality data and device information data. A condition setting unit (3) sets a data item to be summed up, a criterion condition that indicates a condition to be a basis of a quality analysis target, and a comparison condition that indicates a condition to be a target of quality analysis with respect to the quality data and the device information data acquired by the data aggregation unit (1). A distribution difference calculation unit (4) extracts, from the quality data and the device information data acquired by the data aggregation unit (1), data satisfying the criterion condition of the data item set by the condition setting unit (3) and data satisfying the comparison condition, and calculates a frequency distribution for each data item, and outputs data for indicating a deviation degree in frequency distribution between the criterion condition and the comparison condition.

Inventors:
UEDA TAKAFUMI (JP)
Application Number:
PCT/JP2017/026108
Publication Date:
January 24, 2019
Filing Date:
July 19, 2017
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05B19/418
Foreign References:
JP2011258113A2011-12-22
JP2008146621A2008-06-26
JP2005165546A2005-06-23
JP2016523424A2016-08-08
JP2006146324A2006-06-08
JP2008181341A2008-08-07
Attorney, Agent or Firm:
TAZAWA, Hideaki et al. (JP)
Download PDF:



 
Previous Patent: RECOMMENDATION DEVICE

Next Patent: ROTATING ELECTRICAL MACHINE