Title:
QUALITY-CONTROL AND ALIGNMENT ELEMENT FOR ASSAY SUBSTRATES
Document Type and Number:
WIPO Patent Application WO/2010/092505
Kind Code:
A3
Abstract:
A method for fabricating and assessing the quality of printing on substrates used for chemical or biological array testing, and method for ascertaining relative consistency of the deposit reproducibility is described. Generally, the method involves: providing a substrate, providing a solution mixture of a capture moiety and a colorant; depositing an amount of said solution mixture onto said substrate, monitoring the substrate such that the visible indicator colorant manifests in a co-extensive fashion as with the capture moiety on the substrate. In another aspect, the invention relates to a sensor or assay device comprising a physical complex of a number of capture agents and an amount of colorants adhere to least a part of a surface of a substrate.
Inventors:
TAKEUCHI JAMES M (US)
FEASTER SHAWN R (US)
FEASTER SHAWN R (US)
Application Number:
PCT/IB2010/050459
Publication Date:
December 29, 2010
Filing Date:
February 02, 2010
Export Citation:
Assignee:
KIMBERLY CLARK CO (US)
TAKEUCHI JAMES M (US)
FEASTER SHAWN R (US)
TAKEUCHI JAMES M (US)
FEASTER SHAWN R (US)
International Classes:
G01N33/50; G01N21/00; G01N33/53; G01N33/68
Domestic Patent References:
| WO2008005448A2 | 2008-01-10 | |||
| WO2007042964A1 | 2007-04-19 |
Attorney, Agent or Firm:
KUNG, Vincent, T. et al. (Inc.2300 Winchester Roa, Neenah WI, US)
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