Title:
QUALITY DETERMINATION SYSTEM, QUALITY DETERMINATION METHOD, SERVER, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/221030
Kind Code:
A1
Abstract:
The present invention provides a quality determination system capable of determining the quality of inspection targets with higher accuracy, a quality determination method, a server, and a program. A quality determination system 10a comprises: a teaching dataset generation unit 302 that classifies images containing a plurality of inspection target defects in accordance with defect-characterizing brightnesses, and generates a plurality of classified teaching datasets; a storage unit 460b that stores a plurality of machine learning models, which have been respectively constructed on the basis of the plurality of teaching datasets by a machine learning model construction service 80 for constructing machine learning models; a camera unit 460a that captures images of inspection targets; a determination unit 460c that determines the quality of each inspection target 14 imaged by the camera unit 460a on the basis of the plurality of machine learning models stored in the storage unit 460b; and an optimal model selection unit 306 that evaluates the determination results from the determination unit 460c, and selects an optimal machine learning model from among the plurality of machine learning models.
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Inventors:
TANAKA HIROYUMI (JP)
TSUDA TAKAFUMI (JP)
TSUDA TAKAFUMI (JP)
Application Number:
PCT/JP2021/016695
Publication Date:
November 04, 2021
Filing Date:
April 26, 2021
Export Citation:
Assignee:
RYOWA & CO LTD (JP)
International Classes:
G06T7/00
Foreign References:
| JP2012068965A | 2012-04-05 | |||
| JP2006266845A | 2006-10-05 | |||
| JP2019159961A | 2019-09-19 |
Attorney, Agent or Firm:
IMANAKA Takayuki (JP)
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