Title:
QUANTITATIVE ANALYSIS METHOD AND QUANTITATIVE ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/019093
Kind Code:
A1
Abstract:
(Problem) Provided are a quantitative analysis method and a quantitative analysis device that speed up calibration in mass spectrometry using a mass spectrometer, and that are less likely to be affected by a device state (fluctuations in sensitivity). (Solution) This quantitative analysis method using a mass spectrometer for a measurement target comprises: a gas introduction step for introducing, into a mass spectrometer, a mixture of a gas of the measurement target and a carrier gas that is different from the gas of the measurement target and that has at least two natural isotopes; a mass spectrometry step for performing mass spectrometry on the gas of the measurement target and the at least two natural isotopes in the carrier gas, using the mass spectrometer; and a gas concentration calculation step for calculating the concentration of the gas of the measurement target, using, as a calibration reference, an analysis value of the at least two natural isotopes in the carrier gas obtained in the mass spectrometry step.
Inventors:
TOBU YASUHIRO (JP)
AIMOTO MICHIHIRO (JP)
AIMOTO MICHIHIRO (JP)
Application Number:
PCT/JP2023/026460
Publication Date:
January 25, 2024
Filing Date:
July 19, 2023
Export Citation:
Assignee:
NIPPON STEEL CORP (JP)
International Classes:
G01N27/62
Domestic Patent References:
| WO2019225573A1 | 2019-11-28 |
Foreign References:
| US20060151695A1 | 2006-07-13 | |||
| JP2014235088A | 2014-12-15 | |||
| JP2000065797A | 2000-03-03 | |||
| JPH0321867A | 1991-01-30 | |||
| US5051557A | 1991-09-24 |
Attorney, Agent or Firm:
AOKI, Atsushi et al. (JP)
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