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Patent Searching and Data


Title:
QUICK MEASUREMENT METHOD FOR BLADE SURFACE MICROSTRUCTURE BASED ON LIGHT INTERFERENCE TECHNOLOGY
Document Type and Number:
WIPO Patent Application WO/2017/092136
Kind Code:
A1
Abstract:
A quick measurement method for a blade surface microstructure based on light interference technology. The micro-morphologic characteristics of a blade surface are obtained using an optical measurement method instead of scanning electron microscope technology and are quantitatively characterized, so that the problems that the characteristics of the blade surface cannot be directly and quickly obtained and quantitatively characterized are solved. The method has the advantages of quickness, simplicity, easiness, capability of performing quantitative analysis and the like, and can be applied to the quick measurement of a blade surface microstructure.

Inventors:
LI QINGLIN (CN)
MAO HANPING (CN)
ZUO ZHIYU (CN)
NI JIHENG (CN)
SUN JUN (CN)
ZHANG XIAODONG (CN)
Application Number:
PCT/CN2015/099648
Publication Date:
June 08, 2017
Filing Date:
December 30, 2015
Export Citation:
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Assignee:
UNIV JIANGSU (CN)
International Classes:
G01N21/45
Foreign References:
CN103575700A2014-02-12
CN101975780A2011-02-16
JP2000304694A2000-11-02
CN102759510A2012-10-31
Other References:
QI, HONGYAN ET AL.: "Effect of water deficit on stomatal Characteristics and Ultrastructure of Chloroplast in Tomato Leaves", ACTA BOTANICA BOREALI-OCCIDENTALIA SINICA, vol. 29, no. 1, 31 December 2009 (2009-12-31)
Attorney, Agent or Firm:
JW IP LAW FIRM (CN)
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