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Title:
RADIANT FLUX DISTRIBUTION MEASUREMENT METHOD AND RADIANT FLUX DISTRIBUTION MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2015/151488
Kind Code:
A1
Abstract:
Provided are a radiant flux distribution measurement method and radiant flux distribution measurement device capable of enhancing the measurement accuracy of the radiant flux distribution of the horizontal radiant flux of a light source emitting UV-C rays. The radiant flux distribution measurement method is provided with a first step for determining a correction coefficient for calibrating the output of a spectroscope (4); a second step for measuring the light distribution of a light source (1); a third step for changing the distance (Lx) between the light source (1) and an apparent exit (21b) of a port (21) of an integrating sphere (2), measuring the radiant flux per apparent solid angle of the light source (1), and creating a first cumulative radiant flux curve; a fourth step for creating a Rousseau diagram from the light distribution, calculating the radiant flux of the light source (1) per solid angle, and creating a second cumulative radiant flux curve; a fifth step for creating a plurality of graphs in which the first cumulative radiant flux curve is redrawn using solid angles determined by the positions of a plurality of imaginary exits and light sources (1); a sixth step for determining the effective exit (21e) of the port (21); and a seventh step for determining the radiant flux distribution of the horizontal radiant flux of the light source (1) on the basis of the effective exit (21e).

Inventors:
FUKSHIMA HIROSHI
AOKI SAKI
Application Number:
PCT/JP2015/001807
Publication Date:
October 08, 2015
Filing Date:
March 30, 2015
Export Citation:
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Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
G01J1/00; G01M11/00
Foreign References:
JP2012007951A2012-01-12
JPS6438617A1989-02-08
JP2010139446A2010-06-24
Attorney, Agent or Firm:
NISHIKAWA, Yoshikiyo et al. (JP)
Yoshikiyo Nishikawa (JP)
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