Title:
RADIATION DETECTOR
Document Type and Number:
WIPO Patent Application WO/2017/119251
Kind Code:
A1
Abstract:
The radiation detector according to one embodiment of the present invention is provided with: a substrate; a plurality of control lines which are disposed on the substrate, and which extend in a first direction; a plurality of data lines which are disposed on the substrate, and which extend in a second direction that intersects with the first direction; photoelectric conversion units each of which disposed in one of areas segmented by the plurality of control lines and the plurality of data lines, and each of which having a photoelectric conversion element and a thin-film transistor that is electrically connected to a corresponding one of the control lines and a corresponding one of the data lines; a control circuit which is electrically connected to the plurality of control lines, and which switches the plurality of thin-film transistors between ON state and OFF state; a signal detection circuit which is electrically connected to the plurality of data lines; a reference potential unit which is electrically connected to the signal detection circuit; and a determination unit which is electrically connected to the signal detection unit. When the thin-film transistors are in OFF state, the signal detection unit detects a first current integration value via the data lines, and also detects a second current integration value from the reference potential unit. The determination unit determines a start time for radiation incidence on the basis of the difference between the detected first current integration value and the detected second current integration value.
Inventors:
ONIHASHI HIROSHI (JP)
Application Number:
PCT/JP2016/087259
Publication Date:
July 13, 2017
Filing Date:
December 14, 2016
Export Citation:
Assignee:
TOSHIBA ELECTRON TUBES & DEVIC (JP)
International Classes:
H04N5/32; G01T7/00; H01L27/144; H01L27/146; H01L29/786; H04N5/353
Foreign References:
| JP2013157793A | 2013-08-15 | |||
| JP2012095201A | 2012-05-17 | |||
| JP2014526178A | 2014-10-02 | |||
| JP2014526178A | 2014-10-02 |
Attorney, Agent or Firm:
HYUGAJI, Masahiko et al. (JP)
Download PDF:
Previous Patent: FLAW DETECTION DEVICE AND FLAW DETECTION METHOD
Next Patent: ION-SENSITIVE MEMBRANE, ION-SELECTIVE ELECTRODE, AND ION SENSOR
Next Patent: ION-SENSITIVE MEMBRANE, ION-SELECTIVE ELECTRODE, AND ION SENSOR