RADIATION INSPECTION APPARATUS AND RADIATION INSPECTION METHOD

WIPO Patent Application WO/2020/140972

A1

Disclosed are a radiation inspection apparatus (20) and a radiation inspection method. The radiation inspection apparatus (20) comprises: a radiation detection device comprising a ray source and a detector (50) cooperating with the ray source so as to scan and inspect an inspected object (10), wherein the radiation detection device is provided with an inspection channel (24) allowing the inspected object (10) to pass through when same is scanned and inspected; and travelling wheels (27) arranged at the bottom of the radiation detection device and used for the radiation inspection apparatus (20) to travel in an extension direction of the inspection channel (24), wherein the travelling wheels (27) are configured to be capable of rotating 90°, such that the radiation inspection apparatus (20) travels in a direction perpendicular to the extension direction of the inspection channel (24). The radiation inspection apparatus (20) and the radiation inspection method can realize continuous scanning inspection of a plurality of rows of inspected objects (10), thereby improving the use efficiency of the radiation inspection apparatus (20).

CHEN ZHIQIANG (CN)
LI YUANJING (CN)
ZHANG LI (CN)
LI JIANMIN (CN)
SUN SHANGMIN (CN)
ZONG CHUNGUANG (CN)
HU YU (CN)
SONG QUANWEI (CN)
ZHOU HEJUN (CN)
YU WEIFENG (CN)
CAO JINGUO (CN)
FU BING (CN)

PCT/CN2020/070279

July 09, 2020

January 03, 2020

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NUCTECH BEIJING COMPANY LTD (CN)
NUCTECH CO LTD (CN)
UNIV TSINGHUA (CN)

G01V5/00

CN109521480A	2019-03-26
CN209765071U	2019-12-10
CN108732192A	2018-11-02
CN108732192A	2018-11-02
CN104749649A	2015-07-01
CN1660391A	2005-08-31
CN1304037A	2001-07-18
US5917876A	1999-06-29

CCPIT PATENT AND TRADEMARK LAW OFFICE (CN)

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