Title:
RADIATION INTERFERENCE WAVE MEASUREMENT METHOD AND RADIATION INTERFERENCE WAVE MEASUREMENT SYSTEM
Document Type and Number:
WIPO Patent Application WO/2019/043874
Kind Code:
A1
Abstract:
This radiation interference measurement method takes a measurement frequency range as a target range and measures a radiation interference wave from a subject to be measured (12) which is placed on a turn table (11) through an antenna (14) ascendably and descendably mounted on an antenna mast (13). The radiation interference measurement method includes: location control steps (S10, S12, S16, S17) for controlling ascending and descending of the antenna (14) on the antenna mast (13), and for controlling turning of the subject to be measured (12) by the turn table (11); and Fast Fourier transform measurement steps (S11 to S15) for dividing the measurement frequency range in a Fast Fourier transform bandwidth, when a bandwidth of a frequency range that is to be subjected to one time Fast Fourier transform is taken as the Fast Fourier transform bandwidth, and for executing a measurement in a Fast Fourier transform scheme in which a radiation interference wave received by the antenna (14) is Fast-Fourier-transformed, while sequentially moving a plurality of the frequency ranges after the division.
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Inventors:
KOHNO TOSHIYA (JP)
NAKAMURA TETSUYA (JP)
TSUBOI NAOKI (JP)
NAKAMURA TETSUYA (JP)
TSUBOI NAOKI (JP)
Application Number:
PCT/JP2017/031372
Publication Date:
March 07, 2019
Filing Date:
August 31, 2017
Export Citation:
Assignee:
TOYO CORP (JP)
International Classes:
G01R29/08; G01R23/16
Domestic Patent References:
| WO2008023640A1 | 2008-02-28 | |||
| WO2003102610A2 | 2003-12-11 | |||
| WO2010103354A1 | 2010-09-16 | |||
| WO2017178878A1 | 2017-10-19 |
Foreign References:
| JP2011095221A | 2011-05-12 | |||
| JP2006234612A | 2006-09-07 | |||
| US9542358B1 | 2017-01-10 |
Other References:
HARAMOTO ET AL.: "Evaluation method of measuring conducted emission by fast fourier transform", BULLETIN OF TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, 15 November 2010 (2010-11-15), pages 18 - 21
Attorney, Agent or Firm:
NII, Hiromori (JP)
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