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Patent Searching and Data


Title:
RADIATION INTERFERENCE WAVE MEASUREMENT METHOD AND RADIATION INTERFERENCE WAVE MEASUREMENT SYSTEM
Document Type and Number:
WIPO Patent Application WO/2019/202732
Kind Code:
A1
Abstract:
This radiation interference wave measurement method includes: a provisional measurement step (S21) for carrying out broadband measurement which includes peak value detection and a quasi-peak value detection by targeting a measurement frequency range through high-speed Fourier transform executed once by an EMI receiver (16); a calculation step (S22) for calculating the difference between an acquired peak value level and an acquired quasi-peak value level regarding a measurement frequency which becomes a measurement result candidate; a determination step (S23) for determining whether the calculated difference is lower than a predetermined reference value corresponding to the measurement frequency; and an output step in which when it is determined that the difference is lower than the reference value, the result of the broadband measurement is outputted as the interference level of a radiation interference wave (S24), whereas when it is determined that the difference is not less than the reference value, narrow band measurement which is based on the high-speed Fourier transform executed by the EMI receiver (16) is carried out by targeting the measurement frequency within a frequency range narrower than the measurement frequency range, and the acquired result is outputted as the interference level of the radiation interference wave(S25).

Inventors:
NAKAMURA TETSUYA (JP)
TSUBOI NAOKI (JP)
Application Number:
PCT/JP2018/016285
Publication Date:
October 24, 2019
Filing Date:
April 20, 2018
Export Citation:
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Assignee:
TOYO CORP (JP)
International Classes:
G01R29/08; G01R23/16; G01R23/173
Foreign References:
JP2017146272A2017-08-24
JP2007033197A2007-02-08
JP2011095221A2011-05-12
Attorney, Agent or Firm:
NII, Hiromori (JP)
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