RADIATION MEASUREMENT DEVICE - MITSUBISHI ELECTRIC CORP

Title:

RADIATION MEASUREMENT DEVICE

Document Type and Number:

WIPO Patent Application WO/2020/035937

Kind Code:

A1

Abstract:

In this radiation measurement device, first and second pulse height detection circuits (3a, 3b) output pulse height detection signals that rise when a detection pulse obtained from a radiation detector (1) becomes larger than a lower threshold value Lsh or upper threshold value Hsh, respectively, and fall when the detection pulse becomes smaller than the lower threshold value Lsh or upper threshold value Hsh, respectively. Next, first and second rising and falling detection circuits (11a, 11b) are used to detect the rising and falling edges of the pulse height detection signals from the first and second pulse height detection circuits (3a, 3b) in synchronization with a clock pulse from a crystal oscillator (10). A combination circuit (12) combines the outputs from the first and second rising and falling detection circuits (11a, 11b) in synchronization with the clock pulse and thereby outputs a signal corresponding to the part of the detection pulse in the range between the lower threshold value Lsh and upper threshold value Hsh.

Inventors:

YAHATA HIDETAKA (JP)
NAKAI TOSHIMITSU (JP)

Application Number:

PCT/JP2018/030504

Publication Date:

February 20, 2020

Filing Date:

August 17, 2018

Export Citation:

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Assignee:

MITSUBISHI ELECTRIC CORP (JP)

International Classes:

G01T1/17

Domestic Patent References:

WO2009054233A1

2009-04-30

Foreign References:

JPH07162275A	1995-06-23
JP2008215907A	2008-09-18
JP2000074968A	2000-03-14
JP2017501387A	2017-01-12
JP2007327902A	2007-12-20
JP2014001951A	2014-01-09

Other References: