Title:
RADIATION MEASUREMENT PROBE
Document Type and Number:
WIPO Patent Application WO/2017/158903
Kind Code:
A1
Abstract:
A radiation measurement probe of the present invention includes a detection unit 32 and a signal processing unit 34, which are removably connected in the probe axis direction. The detection unit 32 includes: a radiation detector 62 that converts radiation into light; an optical detector 64, which detects the light and outputs detection signals; and a first connector 92 that outputs the detection signals. The signal processing unit 34 includes a second connector 114 removably connected to the first connector 92, and an electronic circuit that processes the detection signals.
Inventors:
YOSHIDA AKIRA (JP)
OSHIKIRI KEISUKE (JP)
OGI YASUYUKI (JP)
SATO HIDENORI (JP)
KATSUYAMA HIRAKU (JP)
TOMIZAWA MASAHIRO (JP)
HIRATA YOSHIAKI (JP)
YAMANO TOSHIYA (JP)
HARA MASAKI (JP)
TANINO TOSHIKAZU (JP)
OSHIKIRI KEISUKE (JP)
OGI YASUYUKI (JP)
SATO HIDENORI (JP)
KATSUYAMA HIRAKU (JP)
TOMIZAWA MASAHIRO (JP)
HIRATA YOSHIAKI (JP)
YAMANO TOSHIYA (JP)
HARA MASAKI (JP)
TANINO TOSHIKAZU (JP)
Application Number:
PCT/JP2016/081824
Publication Date:
September 21, 2017
Filing Date:
October 27, 2016
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G01T1/20; G01T1/16; G01T1/169; G01T7/00
Domestic Patent References:
| WO1999061880A2 | 1999-12-02 |
Foreign References:
| JP2013527927A | 2013-07-04 | |||
| JPH10197645A | 1998-07-31 | |||
| JPS614989A | 1986-01-10 | |||
| JPH04204079A | 1992-07-24 | |||
| US6204505B1 | 2001-03-20 |
Attorney, Agent or Firm:
YKI PATENT ATTORNEYS (JP)
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