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Patent Searching and Data


Title:
RADIATION MEASURING DEVICE AND RADIATION MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2017/018363
Kind Code:
A1
Abstract:
A radiation measuring device (20) is provided with scatterer detectors (10A), absorber detectors (10B), and an arithmetic logic device (12). Pixel electrodes (2) of the scatterer detectors (10A) and the absorber detectors (10B) are disposed in such a way that the distance between the centers of two adjacent pixel electrodes (2) is less than the mean free path of recoil electrons generated through Compton scattering of electromagnetic radiation. The arithmetic logic device (12) determines the incident direction of electromagnetic radiation on the basis of a recoil direction in which the recoil electrons bounce. In this way, an electron-tracking type Compton camera which narrows down the incident direction of electromagnetic radiation using the recoil direction of recoil electrons is implemented as a Compton camera employing semiconductor detectors.

Inventors:
MATSUURA DAISUKE (JP)
KURODA YOSHIKATSU (JP)
GEMBA KEI (JP)
TAKAHASHI TADAYUKI (JP)
WATANABE SHIN (JP)
TAKEDA SHIN'ICHIRO (JP)
YAMAMOTO HIROO (JP)
KOSUGI KAZUMASA (JP)
YAMAMURA KAZUHISA (JP)
Application Number:
PCT/JP2016/071642
Publication Date:
February 02, 2017
Filing Date:
July 22, 2016
Export Citation:
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Assignee:
MITSUBISHI HEAVY IND LTD (JP)
JAPAN AEROSPACE EXPLORATION (JP)
HAMAMATSU PHOTONICS KK (JP)
International Classes:
G01T1/24; G01T1/29
Foreign References:
JP2014185852A2014-10-02
JP2002357661A2002-12-13
JP2008232641A2008-10-02
Other References:
See also references of EP 3316003A4
Attorney, Agent or Firm:
KUDOH Minoru (JP)
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