RADIATION MONITOR AND RADIATION MONITOR ANALYSIS METHOD

Title:

RADIATION MONITOR AND RADIATION MONITOR ANALYSIS METHOD

Document Type and Number:

WIPO Patent Application WO/2018/043068

Kind Code:

A1

Abstract:

The present invention provides a highly reliable radiation monitor, and the like. This radiation monitor (100) is provided with: a radiation detection unit (11) having a radiation detection element (11a) that emits light at a prescribed light emission wavelength; a light emission unit (12) that emits light at a wavelength different from the light emission wavelength; a wavelength selection part (16) that is set to a first mode in which light of the light emission wavelength is transmitted and light from the light emission unit (12) is blocked; optical fibers (15a, 15b, 15c) that transmit light; a light detection unit (17) for converting the light that has passed through the wavelength selection part (16) into electrical pulses; a measurement device (18) for measuring the count rate of the electrical pulses; and an analysis and display device (19) for at least determining whether the light emission unit (12) has deteriorated on the basis of the count rate and the light intensity of the light emission unit (12).

Inventors:

TADOKORO TAKAHIRO (JP)
UENO KATSUNORI (JP)
UENO YUICHIRO (JP)
OKADA KOUICHI (JP)
HATAKEYAMA SHUICHI (JP)
NAGUMO YASUSHI (JP)
SAKAKIBARA YOSHINOBU (JP)
SHIBUTANI TORU (JP)
ITOU TAKAHIRO (JP)

Application Number:

PCT/JP2017/028792

Publication Date:

March 08, 2018

Filing Date:

August 08, 2017

Export Citation:

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Assignee:

HITACHI LTD (JP)

International Classes:

G01T1/20

Foreign References:

JPH0399292A	1991-04-24
JP2013134157A	2013-07-08
JP2006234670A	2006-09-07
JPH034129A	1991-01-10

Other References: