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Patent Searching and Data


Title:
RADIATION TEMPERATURE MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/105551
Kind Code:
A1
Abstract:
The objective of the present invention is to provide a radiation temperature measuring device with which it is possible to prevent a deterioration in temperature measurement accuracy attributable to electromagnetic waves reflected by a measured object. A radiation temperature measuring device (100) is provided with: a reflective-type polarizing plate (2) which reflects polarized light polarized in one direction, from among electromagnetic waves radiated from an object being measured, and transmits or absorbs polarized light polarized in a direction perpendicular to said one direction; and an infrared sensor (1) which detects the polarized light electromagnetic waves that have been polarized in said one direction and have been reflected by the reflective-type polarizing plate (2).

Inventors:
SASAKI HIROYUKI (JP)
SUGIYAMA DAI (JP)
Application Number:
PCT/JP2017/043454
Publication Date:
June 14, 2018
Filing Date:
December 04, 2017
Export Citation:
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Assignee:
ASAHI CHEMICAL IND (JP)
International Classes:
G01J5/06; G02B5/30
Foreign References:
JP6019508B12016-11-02
JPS6112212B21986-04-07
JP2016038537A2016-03-22
JP2007256219A2007-10-04
JPS62266424A1987-11-19
JPS6049850B21985-11-05
JPS57161625A1982-10-05
US4257106A1981-03-17
JP2008541133A2008-11-20
JP2014134630A2014-07-24
JP2011007730A2011-01-13
Other References:
TETSUO TAMURA: "Journal of the Japan Society of Infrared Science and Technology", vol. 8, December 1998, article "5.5 - 7. 9 µm Infrared Imager and Application", pages: 99 - 107
See also references of EP 3553479A4
Attorney, Agent or Firm:
MORI Tetsuya et al. (JP)
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