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Patent Searching and Data


Title:
RECORDING MEDIUM, FULLERENE THIN FILM MANUFACTURING METHOD, RECORDING AND REPRODUCING DEVICE, INFORMATION RECORDING METHOD, AND INFORMATION READ-OUT METHOD
Document Type and Number:
WIPO Patent Application WO/2017/002798
Kind Code:
A1
Abstract:
The recording medium according to the present invention is characterized by comprising: a substrate; a platinum layer formed on the substrate and having a preferentially oriented (111) surface; and a fullerene mono-crystalline thin film which is a recording layer formed on the platinum layer, wherein, on the surface of the fullerene thin film, an average value of average roughnesses Ra for at least four fields of view, which are measured using an atomic force microscope, is 0.5 nm or less.

Inventors:
TONEGAWA Sho (13-9 Shibadaimon 1-chome, Minato-k, Tokyo 18, 〒1058518, JP)
ICHIKAWA Masatoshi (13-9 Shibadaimon 1-chome, Minato-k, Tokyo 18, 〒1058518, JP)
HANAWA Kenzo (13-9 Shibadaimon 1-chome, Minato-k, Tokyo 18, 〒1058518, JP)
Application Number:
JP2016/069117
Publication Date:
January 05, 2017
Filing Date:
June 28, 2016
Export Citation:
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Assignee:
SHOWA DENKO K.K. (13-9, Shibadaimon 1-chome Minato-k, Tokyo 18, 〒1058518, JP)
International Classes:
G11B9/04; C01B31/02; G11B9/14
Attorney, Agent or Firm:
SHIGA Masatake et al. (1-9-2, Marunouchi Chiyoda-k, Tokyo 20, 〒1006620, JP)
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