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Title:
REDUCTION OF SURFACE LEAKAGE CURRENT BY SURFACE PASSIVATION OF CdZnTe AND RELATED MATERIALS USING HYPERTHERMAL OXYGEN ATOMS
Document Type and Number:
WIPO Patent Application WO1999027562
Kind Code:
A3
Abstract:
Reduction of surface leakage current by surface passivation of CdZnTe (12) and related materials using hyperthermal oxygen atoms (36). Surface effects are important in the performance of CdZnTe room-temperature radiation detectors used as spectrometers since the dark current is often dominated by surface leakage. A process using high-kinetic-energy, neutral oxygen atoms ( SIMILAR 3eV) to treat the surface of CdZnTe detectors at or near ambient temperatures is described. Improvements in detector performance include significantly reduced leakage current, which results in lower detector noise and greater energy resolution for radiation measurements of gamma- and X-rays, thereby increasing the accuracy and sensitivity of measurements of radionuclides having complex gamma-ray spectra, including special nuclear materials.

Inventors:
HOFFBAUER MARK A (US)
PRETTYMAN THOMAS H (US)
Application Number:
PCT/US1998/025370
Publication Date:
September 16, 1999
Filing Date:
November 24, 1998
Export Citation:
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Assignee:
UNIV CALIFORNIA (US)
HOFFBAUER MARK A (US)
PRETTYMAN THOMAS H (US)
International Classes:
H01L31/0296; H01L31/115; H01L31/18; (IPC1-7): H01L21/316
Foreign References:
US4474829A1984-10-02
US5627377A1997-05-06
US5271800A1993-12-21
Other References:
LIN C. T., ET AL.: "EFFECTS OF PASSIVATION AND EXTRACTION SURFACE TRAP DENSITY ON THE 1/F NOISE OF HGCDTE PHOTOCONDUCTIVE DETECTOR.", IEEE PHOTONICS TECHNOLOGY LETTERS., IEEE SERVICE CENTER, PISCATAWAY, NJ., US, vol. 09., no. 02., 1 February 1997 (1997-02-01), US, pages 232 - 234., XP000683875, ISSN: 1041-1135, DOI: 10.1109/68.553102
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