Title:
REFLECTANCE PROPERTY MEASUREMENT DEVICE AND REFLECTANCE PROPERTY MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2012/128113
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide a technique capable of promptly performing the various aspects of measurement relating to reflectance properties of samples with a high degree of accuracy and with a simple configuration, regardless of variation in spectral distribution of illumination light. For this purpose, a first spectral distribution of a first mixed light obtained by mixing a first reflected light and the illumination light at the first ratio in a first sample, and a first forward voltage of a light-emitting device are obtained. A second spectral distribution of a second mixed light obtained by mixing the first reflected light and the illumination light at the second ratio, and a second forward voltage of the light-emitting device are obtained. A third spectral distribution of the first mixed light obtained by mixing the second reflected light and the illumination light at the first ratio in a second sample, and a third forward voltage of the light-emitting device are obtained. A fourth spectral distribution of the second mixed light obtained by mixing the second reflected light and the illumination light at the second ratio, and a fourth forward voltage of the light-emitting device are obtained. An approximate function using a forward voltage showing the spectral distribution of the illumination light is derived on the basis of the first to fourth forward voltages and the first to fourth spectral distributions. As to the time of application of a fifth forward voltage to the light-emitting device, the spectral distribution of the illumination light is estimated, and the spectral reflectance factor of a third sample is calculated.
Inventors:
IMURA KENJI (JP)
Application Number:
PCT/JP2012/056338
Publication Date:
September 27, 2012
Filing Date:
March 13, 2012
Export Citation:
Assignee:
KONICA MINOLTA SENSING INC (JP)
IMURA KENJI (JP)
IMURA KENJI (JP)
International Classes:
G01J3/28; G01N21/27
Domestic Patent References:
| WO2009119367A1 | 2009-10-01 |
Foreign References:
| JP2007225312A | 2007-09-06 | |||
| JP2623613B2 | 1997-06-25 |
Attorney, Agent or Firm:
YOSHITAKE Hidetoshi et al. (JP)
Hidetoshi Yoshitake (JP)
Hidetoshi Yoshitake (JP)
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