Title:
REFLECTED LIGHT MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/157511
Kind Code:
A1
Abstract:
Provided is a reflected light measurement device having a simple structure and good workability of processing and assembly while eliminating the influence of stray light caused by reflection on the top surface and bottom surface of a window.
In a part of a window (26) of a reflected light measurement device provided with: a housing case (25) which houses an optical system including a light source (21) for applying light to a surface to be measured, and a light receiving part (24) for receiving reflected light from the surface to be measured, and has an opening toward the surface to be measured; and the window (26) for closing the opening of the housing case (25), an emission window (27) inclined at a predetermined angle with respect to the optical axis (Y) of light emitted from the light source (21) is provided, and the light emitted from the light source (21) is applied to the surface to be measured via the emission window (27).
Inventors:
OKUMURA TAKETO (JP)
ISHITOBI TSUYOSHI (JP)
ISHITOBI TSUYOSHI (JP)
Application Number:
PCT/JP2014/058840
Publication Date:
October 02, 2014
Filing Date:
March 27, 2014
Export Citation:
Assignee:
DKK TOA CORP (JP)
International Classes:
G01N21/47
Foreign References:
| JPH07301519A | 1995-11-14 | |||
| JPH03152443A | 1991-06-28 | |||
| JPH08250569A | 1996-09-27 | |||
| JP2002006039A | 2002-01-09 | |||
| JPS59121659U | 1984-08-16 | |||
| JP2008164477A | 2008-07-17 |
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