Title:
REFLECTION CHARACTERISTIC MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/208937
Kind Code:
A1
Abstract:
This reflection characteristic measuring device includes a diffuse reflecting surface, and employs a plurality of optical systems having mutually different geometries to measure a plurality of mutually different types of reflection characteristic, wherein the measured reflection characteristics are corrected using an error generated when light emitted from an object of measurement is reflected from the diffuse reflecting surface and illuminates the object of measurement. The reflection characteristic measuring device according to the present invention is therefore capable of reducing errors resulting from recursive diffused illumination.
Inventors:
KAWANO TOSHIO (JP)
KAWASAKI TAKASHI (JP)
KAWASAKI TAKASHI (JP)
Application Number:
PCT/JP2017/019395
Publication Date:
December 07, 2017
Filing Date:
May 24, 2017
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01N21/57; G01J3/50; G01N21/27
Domestic Patent References:
| WO2017094559A1 | 2017-06-08 |
Foreign References:
| JP2012103236A | 2012-05-31 | |||
| JPH1172388A | 1999-03-16 | |||
| JP2006145374A | 2006-06-08 | |||
| JP2007093273A | 2007-04-12 | |||
| US20140350895A1 | 2014-11-27 | |||
| JP2007517187A | 2007-06-28 |
Other References:
REFLECTANCE/TRANSMITTANCE SPHERES, 30 May 2016 (2016-05-30), XP055541244, Retrieved from the Internet [retrieved on 20170728]
See also references of EP 3467479A4
See also references of EP 3467479A4
Attorney, Agent or Firm:
KOTANI, Etsuji et al. (JP)
Download PDF: