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Patent Searching and Data


Title:
REFLECTION / TRANSMISSION CHARACTERISTIC MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/110267
Kind Code:
A1
Abstract:
To suppress error in measurement of reflection / transmission characteristics, suppress complexity of the structure of a reflection / transmission characteristic measuring device, and suppress complexity of control in the reflection / transmission characteristic measuring device, in this reflection / transmission characteristic measuring device, a detection signal corresponding to reflected light or transmitted light is integrated and the integrated signal is outputted; if the integrated signal is a first integrated signal when performing white calibration and the integrated signal is a second integrated signal when performing measurement, then, (1) when performing white calibration, illumination light is emitted only during a first light emission time out of at least one light emission time, and the at least one light emission time is subjected to correction processing such that the smaller the first integrated signal becomes, the longer the post-correction at least one light emission time becomes, and (2) when performing measurement, illumination light is emitted only during a second light emission time out of the at least one light emission time.

Inventors:
SAWAMURA, Shigeki (INC. 2-7-2, Marunouchi, Chiyoda-k, Tokyo 15, 〒1007015, JP)
Application Number:
JP2017/042520
Publication Date:
June 21, 2018
Filing Date:
November 28, 2017
Export Citation:
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Assignee:
KONICA MINOLTA, INC. (2-7-2, Marunouchi Chiyoda-k, Tokyo 15, 〒1007015, JP)
International Classes:
G01J3/50; G01J1/46; G01J3/02; G01N21/27
Foreign References:
JP2010127661A2010-06-10
JP2007057529A2007-03-08
JP2011242392A2011-12-01
JP2008232920A2008-10-02
US20030048449A12003-03-13
Attorney, Agent or Firm:
KOYO INTERNATIONAL PATENT FIRM (17F, Tokyo Takarazuka Bldg. 1-1-3, Yurakucho, Chiyoda-k, Tokyo 06, 〒1000006, JP)
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