REFRACTIVE INDEX MEASUREMENT DEVICE AND REFRACTIVE INDEX MEASUREMENT METHOD

WIPO Patent Application WO/2012/023481

A1

A refractive index measurement device (1) comprises a light source (10), a measurement cell (12, 22) that includes a sample (125, 226) the refractive index of which is to be measured, and diffracts light incident from the light source, a detector (13) that detects the amount of light in at least one diffraction order including a diffraction order other than a zero order of diffracted light emitted from the measurement cell, and a controller (15) that finds the refractive index of the sample corresponding to the measured value of the amount of the diffracted light in at least one diffraction order detected by the detector. The measurement cell comprises a first substrate (121, 221) and a second substrate (121, 221) that are disposed so as to face each other, and a diffraction grating (123, 225) disposed between the first and second substrates, the diffraction grating comprises a plurality of members the width of each of which in the direction parallel to the first substrate surface decreases in a stepwise shape from the first substrate toward the second substrate, and the sample (125, 226) the refractive index of which is to be measured is filled into a space in which the diffraction grating is not formed within a space between the first and second substrates.

SAITO YUKA (JP)
HASHIMOTO NOBUYUKI (JP)

PCT/JP2011/068336

February 23, 2012

August 04, 2011

Click for automatic bibliography generation  

CITIZEN HOLDINGS CO LTD (JP)
SAITO YUKA (JP)
HASHIMOTO NOBUYUKI (JP)

G01N21/41; G01N21/03

JPH0572126A	1993-03-23
JP2005098743A	2005-04-14
JP2002168780A	2002-06-14
JP2006170727A	2006-06-29
JP2007292509A	2007-11-08

AOKI, Atsushi et al. (JP)
Aoki 篤 (JP)

View/Download PDF      PDF Help

Previous Patent: VIEWPOINT LOCATION COMPUTATION DEVICE

Next Patent: ANTIBACTERIAL DISPERSION