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Patent Searching and Data


Title:
RESIST COMPOSITION AND RESIST PATTERN FORMATION METHOD
Document Type and Number:
WIPO Patent Application WO/2022/265002
Kind Code:
A1
Abstract:
Provided is a resist composition comprising: a resin component having a constituent unit (a01a) having a polycyclic lactone-containing ring group and a constituent unit (a02) represented by general formula (a0-2); and a compound (B0) represented by general formula (b0). In the formulae, Ra05 to Ra08 independently represent a hydrogen atom or the like; X0 represents a bromine atom or an iodine atom; Rm represents a hydroxy group or the like; 1 ≦ nb1+nb2 ≦ 5; Yb0 represents a bivalent linking group or a single bond; Vb0 represents a single bond or the like; R0 represents a hydrogen atom or the like; Mm+ represents an m-valent organic cation; and m represents an integer of 1 or more.

Inventors:
UEHARA TAKUYA (JP)
MATSUSHITA TETSUYA (JP)
MIYAKAWA JUNICHI (JP)
NGUYEN KHANHTIN (JP)
KATO HIROKI (JP)
FUJIMOTO YUUKI (JP)
Application Number:
PCT/JP2022/023758
Publication Date:
December 22, 2022
Filing Date:
June 14, 2022
Export Citation:
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Assignee:
TOKYO OHKA KOGYO CO LTD (JP)
International Classes:
G03F7/039; C07D327/06; C07D333/76; C08F220/12; G03F7/004; G03F7/20
Foreign References:
JP2021080245A2021-05-27
JP2020038358A2020-03-12
JP2021026227A2021-02-22
JP2021033262A2021-03-01
JP2021081708A2021-05-27
Attorney, Agent or Firm:
TAZAKI Akira et al. (JP)
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