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Title:
RESIST UNDERLAYER FILM FORMING COMPOSITION
Document Type and Number:
WIPO Patent Application WO/2019/059210
Kind Code:
A1
Abstract:
This resist underlayer film forming composition contains a resin containing a unit structure represented by formula (1): [in formula (1), R1 represents a thiadiazole group which is optionally substituted with a C1-6 alkyl group optionally interrupted by a carboxy group, a C1-6 alkyl group optionally substituted with a hydroxyl group, or a C1-4 alkylthio group, and R2 represents a hydrogen atom or formula (2): (in formula (2), R1 is the same as defined above, and * represents a binding moiety)]. The resist underlayer film forming composition provides a resist underlayer film which has excellent solvent resistance, excellent optical parameters, an excellent dry etching rate, and excellent embeddability.

Inventors:
TAMURA MAMORU (JP)
OGATA HIROTO (JP)
KISHIOKA TAKAHIRO (JP)
Application Number:
PCT/JP2018/034584
Publication Date:
March 28, 2019
Filing Date:
September 19, 2018
Export Citation:
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Assignee:
NISSAN CHEMICAL CORP (JP)
International Classes:
G03F7/11; C08G59/14; G03F7/20; G03F7/26; H01L21/027
Domestic Patent References:
WO2003071357A12003-08-28
WO2017002653A12017-01-05
WO2015041208A12015-03-26
WO2014024836A12014-02-13
Foreign References:
JP2010164965A2010-07-29
JP2010186174A2010-08-26
Attorney, Agent or Firm:
TSUKUNI & ASSOCIATES et al. (JP)
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