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Title:
RESISTANCE CHANGE ELEMENT, MANUFACTURING METHOD THEREOF, MEMORY INCLUDING THE ELEMENT, AND DRIVE METHOD OF THE MEMORY
Document Type and Number:
WIPO Patent Application WO/2005/041303
Kind Code:
A1
Abstract:
There is provided a resistance change element which can lower the drive voltage of an RRAM expected to be a high-speed memory having a low power consumption and suppress irregularities of the electric pulse width for realizing the same resistance change. The resistance change element includes a first electrode, a layer formed on the first electrode and having a resistance changed by applying an electric pulse, and a second electrode formed on this layer. The layer has a perovskite structure. The layer has at least one of a concave portion and a convex portion at the boundary with at least one of the first electrode and the second electrode.

Inventors:
SUGITA YASUNARI
ODAGAWA AKIHIRO
ADACHI HIDEAKI
YOTSUHASHI SATOSHI
KANNO TSUTOMU
OHNAKA KIYOSHI
Application Number:
PCT/JP2004/015728
Publication Date:
May 06, 2005
Filing Date:
October 22, 2004
Export Citation:
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Assignee:
MATSUSHITA ELECTRIC IND CO LTD (JP)
SUGITA YASUNARI
ODAGAWA AKIHIRO
ADACHI HIDEAKI
YOTSUHASHI SATOSHI
KANNO TSUTOMU
OHNAKA KIYOSHI
International Classes:
G11C13/00; H01L21/02; H01L27/24; H01L45/00; G11C11/56; (IPC1-7): H01L27/105; G11C13/00
Foreign References:
JP2003068984A2003-03-07
JP2003188349A2003-07-04
JPH11121624A1999-04-30
JPH0945780A1997-02-14
JP2003068854A2003-03-07
JPH1166654A1999-03-09
Other References:
ZHUANG W.W. ET AL.: "Novel colossal magnetoresistive thin film nonvolatile resistance random access memory (RRAM)", INTERNATIONAL ELECTRON DEVICES MEETING, 2002, pages 193 - 196, XP010626021
Attorney, Agent or Firm:
Kamada, Koichi (TOMOE MARION BLDG. 4-3-1, Nishitenma, Kita-k, Osaka-shi Osaka 47, JP)
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