Title:
RESISTANCE MEASUREMENT DEVICE AND RESISTANCE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2018/101233
Kind Code:
A1
Abstract:
A resistance measurement device is provided with a current supply unit CS for supplying a supply current Io to a supply-side conductive part from among conductive parts P, a current draw-in unit CM for drawing in a draw-in current Ii from a draw-in-side conductive part from among the conductive parts, a supply-side voltage detection unit VM1 for detecting a supply-side voltage V1 that is the voltage between the supply-side conductive part and a voltage measurement conductive part that is a conductive part different from the supply-side conductive part and the draw-in-side conductive part, a draw-in-side voltage detection unit VM2 for detecting a draw-in-side voltage V2 that is the voltage between the draw-in-side conductive part and the voltage measurement conductive part, and a resistance calculation unit 22 for calculating a resistance value for a connection part paired with the supply-side conductive part on the basis of the supply current Io and the supply-side voltage V1 and calculating a resistance value for a connection part paired with the draw-in-side conductive part on the basis of the draw-in current Ii and the draw-in-side voltage V2.
Inventors:
YAMASHITA MUNEHIRO (JP)
Application Number:
PCT/JP2017/042509
Publication Date:
June 07, 2018
Filing Date:
November 28, 2017
Export Citation:
Assignee:
NIDEC READ CORP (JP)
International Classes:
G01R27/02
Foreign References:
| JP2013051355A | 2013-03-14 | |||
| JP2004101453A | 2004-04-02 | |||
| JP2006047172A | 2006-02-16 |
Attorney, Agent or Firm:
YANAGINO Takao et al. (JP)
Download PDF:
Previous Patent: CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE
Next Patent: RESISTANCE MEASUREMENT DEVICE AND RESISTANCE MEASUREMENT METHOD
Next Patent: RESISTANCE MEASUREMENT DEVICE AND RESISTANCE MEASUREMENT METHOD