Title:
RETRO-REFLECTION MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/082416
Kind Code:
A1
Abstract:
Disclosed is a retro-reflection measuring device, comprising one or more sampling devices (2) with diaphragms (22) and reflectors (21) with holes, and one or more measuring devices (3) corresponding to the sampling devices (2) in quantity. Measurement of retro-reflection characteristics under a plurality of different observation angles can be achieved simultaneously by one-time measurement of the retro-reflection measuring device. This is suitable for accurate adjustment of various observation angles and the size of a measuring zone by flexibly selecting the size of the diaphragms and the reflectors with holes, and no other intermediate device is needed; optical signals of the achieved zone are free of defects, and measuring accuracy is high; and various colour filters, monitoring devices and the like are arranged to achieve diversified measuring functions. The retro-reflection measuring device can be widely applied to various scenarios such as laboratories, industrial production lines, and field rapid measurement.
Inventors:
PAN JIANGEN (CN)
Application Number:
PCT/CN2015/076082
Publication Date:
June 02, 2016
Filing Date:
April 08, 2015
Export Citation:
Assignee:
EVERFINE PHOTO E INFORMATION CO LTD (CN)
International Classes:
G01N21/55
Domestic Patent References:
| WO2006091968A2 | 2006-08-31 |
Foreign References:
| CN204214774U | 2015-03-18 | |||
| CN104359866A | 2015-02-18 | |||
| CN203561375U | 2014-04-23 | |||
| CN2505833Y | 2002-08-14 | |||
| CN1493910A | 2004-05-05 | |||
| US20120287432A1 | 2012-11-15 |
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