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Patent Searching and Data


Title:
RF CHARACTERISTIC MEASUREMENT METHOD AND SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/113374
Kind Code:
A1
Abstract:
Disclosed is an RF characteristic measurement system comprising: a shield box in which a DUT accessing a network on mobile by using an access point antenna and an antenna module is provided, which receives an RF signal of the AP antenna; a test device for generating the RF signal to be transmitted to the DUT, and measuring the RF characteristic of the DUT by using an RF characteristic signal received from the DUT; and a control device for controlling the operation of the DUT and the operation of the test device, which are necessary for measuring the RF characteristic of the DUT, wherein the test device includes: an attenuator for adjusting the output power of the RF signal to be input into the DUT; a transmission/reception path separator, which is electrically connected to the AP antenna and separates transmitted/received RF signals from each other; and an AP board, which is electrically connected to the attenuator and the transmission/reception path separator and operates as an access point for the DUT. According to the present invention, both the RF characteristic and throughput of a device to be tested can be measured using an SoC AP board.

Inventors:
RHA SEUNG HYUN (KR)
HAN YUNG HA (KR)
LEE HO SUN (KR)
Application Number:
PCT/KR2022/019892
Publication Date:
June 22, 2023
Filing Date:
December 08, 2022
Export Citation:
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Assignee:
MILIWAVE CO LTD (KR)
International Classes:
H04B17/19; G01R23/02; H04B17/00; H04B17/10
Foreign References:
KR20160018573A2016-02-17
KR20150009969A2015-01-27
KR20130096696A2013-08-30
KR20180011765A2018-02-02
US20180102860A12018-04-12
Attorney, Agent or Firm:
YOON, Jae Seung (KR)
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