Title:
RIGIDITY MEASUREMENT DEVICE AND RIGIDITY MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2018/138943
Kind Code:
A1
Abstract:
A rigidity measurement device (200) for measuring the rigidity of a measurement object is provided with a load estimation unit (240), a displacement calculation unit (230), and a rigidity calculation unit (250). The load estimation unit (240) estimates a load exerted on a measurement point set on the measurement object using a captured image of the measurement object. The displacement calculation unit (230) calculates a displacement of the measurement point using the captured image. The rigidity calculation unit (250) calculates the rigidity of the measurement object using the load and the displacement.
Inventors:
IMAGAWA TARO
NODA AKIHIRO
KUSAKA HIROYA
NODA AKIHIRO
KUSAKA HIROYA
Application Number:
PCT/JP2017/021087
Publication Date:
August 02, 2018
Filing Date:
June 07, 2017
Export Citation:
Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
G01M5/00; G01B11/00; G01B11/16
Domestic Patent References:
WO2013191219A1 | 2013-12-27 | |||
WO2016047093A1 | 2016-03-31 |
Foreign References:
JP2016084579A | 2016-05-19 | |||
JP2007240218A | 2007-09-20 | |||
JP2011174874A | 2011-09-08 | |||
JP2006329628A | 2006-12-07 | |||
JP2007163390A | 2007-06-28 | |||
JP2000055776A | 2000-02-25 | |||
JP2000055776A | 2000-02-25 |
Other References:
SATORU YONEYAMA ET AL.: "Noncontact Deflection Distribution Measurement of Bridges Using Digital Image Correlation", JOURNAL OF JSNDI, vol. 55, no. 3, 1 March 2006 (2006-03-01), pages 119 - 125, XP055471458
See also references of EP 3575766A4
HIROYUKI KISU ET AL.: "A study for identification of bending rigidity of a beam", TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS, vol. 70, no. 698, 2004
See also references of EP 3575766A4
HIROYUKI KISU ET AL.: "A study for identification of bending rigidity of a beam", TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS, vol. 70, no. 698, 2004
Attorney, Agent or Firm:
KAMATA Kenji et al. (JP)
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