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Title:
RING OSCILLATOR AND TEST METHOD
Document Type and Number:
WIPO Patent Application WO/2023/173532
Kind Code:
A1
Abstract:
A ring oscillator and a test method, which belong to the technical field of reliability testing. The ring oscillator comprises a first logic gate (10), a second logic gate (20) and a switching circuit (30). The first logic gate (10) is configured to receive a test signal. The second logic gate (20) comprises a first NAND gate (21) and a first NOR gate (22), which are sequentially connected, wherein an output end of the second logic gate (20) is connected to an input end of the first logic gate (10), and the second logic gate (20) is configured to receive an input of the first logic gate (10), so as to form a loop. The switching circuit (30) comprises a first switching circuit (31) and a second switching circuit (32), wherein the first switching circuit (31) may be configured to control the connection/disconnection of a power supply end of the first NAND gate (21) and a grounding end of the first NOR gate (22); and the second switching circuit (31) is configured to control the connection/disconnection of a grounding end of the first NAND gate (21). When an NBTI test is performed on a device, NBTI effects of an NAND gate and an NOR gate regarding the device are more obvious, and therefore the accuracy of the NBTI effect test regarding the device can be improved, such that the service life of the device can be accurately predicted.

Inventors:
CHEN CHAN (CN)
QIU ANPING (CN)
Application Number:
PCT/CN2022/089093
Publication Date:
September 21, 2023
Filing Date:
April 25, 2022
Export Citation:
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Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
H03K3/03; G01R31/28; H03K3/354
Foreign References:
CN109428569A2019-03-05
US20180089052A12018-03-29
CN107888172A2018-04-06
CN107450010A2017-12-08
US20090189703A12009-07-30
US20080155282A12008-06-26
US20140197895A12014-07-17
JP2012151662A2012-08-09
Attorney, Agent or Firm:
BEIJING INTELLEGAL INTELLECTUAL PROPERTY AGENT LTD. (CN)
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