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Patent Searching and Data


Title:
RISK ASSESSMENT DEVICE, RISK ASSESSMENT METHOD, AND RISK ASSESSMENT PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/179937
Kind Code:
A1
Abstract:
This risk assessment device is equipped with: a parameter storage unit (332) for calculating and storing one or more parameters pertaining to piping system items, in order to calculate a target failure curve for a plurality of processing devices, on the basis of calculation data in a storage unit (4) which stores, for each processing device, piping system items which are items pertaining to the piping system in which the processing devices are provided, and a failure year number, which is the number of years until failure will occur; a calculation conditions acquisition unit (333) for acquiring piping system items for each of the target processing devices; a parameter acquisition unit (334) for acquiring calculation parameters for deriving the target failure curve on the basis of the stored parameters and the piping system items for the acquired target processing devices; and a failure curve calculation unit (337) for calculating the target failure curve on the basis of the calculation parameters.

Inventors:
MITA TETSUYA (JP)
HOU ALAN (JP)
Application Number:
PCT/JP2018/005025
Publication Date:
October 04, 2018
Filing Date:
February 14, 2018
Export Citation:
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Assignee:
TLV CO LTD (JP)
International Classes:
G05B23/02
Foreign References:
JP2007328522A2007-12-20
JP2008293106A2008-12-04
JP5884000B12016-03-15
Other References:
See also references of EP 3584656A4
Attorney, Agent or Firm:
R&C IP LAW FIRM (JP)
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