Title:
RISK ASSESSMENT DEVICE, RISK ASSESSMENT METHOD, AND RISK ASSESSMENT PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/179938
Kind Code:
A1
Abstract:
A risk assessment device equipped with a processing device group calculation unit (34) for calculating the failure occurrence probability of a processing device group which includes one piping system and a plurality of processing devices provided in the piping system, wherein the processing device group calculation unit (34) is equipped with: a calculation method storage unit (341) for storing a failure occurrence probability calculation method which corresponds to the positional relationship between the processing devices which constitute the processing device group; an individual probability acquisition unit (342) for acquiring an individual probability, which is the failure occurrence probability of each of the target processing devices, which are the processing devices of a target processing device group being targeted; a positional relationship acquisition unit (343) which acquires the target positional relationship, which is the positional relationship between the target processing devices in the target processing device group; and a failure occurrence probability calculation unit (344) which, on the basis of the calculation method that corresponds to the target positional relationship, calculates the target failure occurrence probability, which is the failure occurrence probability of the target processing device group, by using the acquired individual probabilities.
Inventors:
MITA TETSUYA (JP)
HOU ALAN (JP)
HOU ALAN (JP)
Application Number:
PCT/JP2018/005029
Publication Date:
October 04, 2018
Filing Date:
February 14, 2018
Export Citation:
Assignee:
TLV CO LTD (JP)
International Classes:
G05B23/02
Foreign References:
| JP2012234226A | 2012-11-29 | |||
| JP2006202171A | 2006-08-03 |
Attorney, Agent or Firm:
R&C IP LAW FIRM (JP)
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