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Patent Searching and Data


Title:
RISK EVALUATION SYSTEM FOR PROCESS SYSTEM, RISK EVALUATION PROGRAM, AND RISK EVALUATION METHOD
Document Type and Number:
WIPO Patent Application WO/2015/152317
Kind Code:
A1
Abstract:
This risk evaluation system for a process system is equipped with: a storage unit, an operation unit, a calculation unit, a risk evaluation unit, and a display unit. The calculation unit calculates first and second factors to be used for risk evaluation related to specific constituent devices of respective processes on the basis of predetermined information about the specific constituent devices. The risk evaluation unit generates device risk evaluation information to be used for displaying a device risk evaluation matrix, including plot images that are defined by two axes comprising the first and second factors and plotted on the basis of the calculated first and second factors of the specific constituent devices. In addition, the risk evaluation unit generates the device risk evaluation information in such a manner as to achieve a display mode in which the plot images of the respective specific devices constituting the same process can be identified from one another.

Inventors:
IHARA KENTA (JP)
MIYAMAE YOSHIO (JP)
Application Number:
PCT/JP2015/060293
Publication Date:
October 08, 2015
Filing Date:
March 31, 2015
Export Citation:
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Assignee:
TLV CO LTD (JP)
International Classes:
G05B23/02
Foreign References:
JP2013088828A2013-05-13
JP2010073121A2010-04-02
JP2010146186A2010-07-01
JP2004227298A2004-08-12
JP2013061695A2013-04-04
Other References:
See also references of EP 3128385A4
Attorney, Agent or Firm:
SASAKI, Yasushi et al. (JP)
Yasushi Sasaki (JP)
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