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Title:
ROLL DISPLACEMENT MEASUREMENT METHOD AND ROLL DISPLACEMENT MEASUREMENT DEVICE USING SAME, AND FILM THICKNESS MEASUREMENT METHOD AND FILM THICKNESS MEASUREMENT DEVICE USING SAME
Document Type and Number:
WIPO Patent Application WO/2012/073401
Kind Code:
A1
Abstract:
The present invention measures, with high precision, the displacement of a roll to which an object to be measured is attached, and also measures, with high precision, the thickness dimensions of the object to be measured, irrespective of the material of the object to be measured. A plurality of markings (2a) parallel to each other and extending along a roll axis is provided to the peripheral surface of a roll (2), and proximity sensors (18, 19) for detecting the approach of the markings are provided to a detection head (5), the proximity sensors being at mutually facing positions on opposite sides of the central axis of the roll. The roll displacement measurement method comprises: a step of scanning the detection head and determining a first detection time difference between the mutually-facing proximity sensors and a first rotational speed in the roll in a state where a film (20) has not been attached to the roll; a step of scanning the detection head and determining a second detection time difference between the mutually-facing proximity sensors and a second rotational speed in the roll in a state where the film has been attached to the roll; and a step of determining the displacement of the roll on the basis of the first and second detection time differences and the first and second rotational speeds.

Inventors:
FUNAOKA HIDEHIKO (JP)
Application Number:
PCT/JP2011/004053
Publication Date:
June 07, 2012
Filing Date:
July 15, 2011
Export Citation:
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Assignee:
NOGATA TETSURO (JP)
FUNAOKA HIDEHIKO (JP)
International Classes:
G01B21/08; G01B7/00; G01B11/06
Foreign References:
JPH01291104A1989-11-22
JPH03123811A1991-05-27
JPS5598304A1980-07-26
JP2002350125A2002-12-04
JPH11248425A1999-09-17
JPH1082632A1998-03-31
Attorney, Agent or Firm:
NAKOSHI, Hideo et al. (JP)
Hideo Nagoshi (JP)
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Claims: