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Patent Searching and Data


Title:
SAMPLE ANALYSIS DEVICE AND SAMPLE ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2011/155489
Kind Code:
A1
Abstract:
Disclosed are an analysis device and an analysis method which prevent non-uniformities in the adhesion of magnetic particles (10) and which detect with greater accuracy and precision. The disclosed sample analysis device is provided with a flow channel (15) through which a sample containing magnetic particles (10) flows, and a magnetic field generating means (12) which generates a magnetic field for capturing the aforementioned magnetic particles (10) in a magnetic particle capturing region in said flow channel (15). The disclosed sample analysis device is configured such that the cross-section area of the downstream end of the flow channel in the aforementioned magnetic particle capture region is greater than that of the upstream end thereof, and/or is configured such that the magnitude of the magnetic field generated by the aforementioned magnetic field generating means (12) is greater downstream than upstream of the aforementioned magnetic particle capture region.

Inventors:
INABA TORU (JP)
MATSUOKA SHINYA (JP)
SAKAZUME TAKU (JP)
YAMASHITA YOSHIHIRO (JP)
SHIMADA MASAFUMI (JP)
KOGI OSAMU (JP)
HARADA YUSHI (JP)
Application Number:
PCT/JP2011/063046
Publication Date:
December 15, 2011
Filing Date:
June 07, 2011
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
INABA TORU (JP)
MATSUOKA SHINYA (JP)
SAKAZUME TAKU (JP)
YAMASHITA YOSHIHIRO (JP)
SHIMADA MASAFUMI (JP)
KOGI OSAMU (JP)
HARADA YUSHI (JP)
International Classes:
G01N35/00; B03C1/00; G01N33/543; G01N35/08
Foreign References:
JPH07248330A1995-09-26
JPH07209189A1995-08-11
JPH10509798A1998-09-22
JPH09210999A1997-08-15
JP2000065833A2000-03-03
JP2008051813A2008-03-06
JPH0862224A1996-03-08
JPH11242033A1999-09-07
Other References:
See also references of EP 2581746A4
Attorney, Agent or Firm:
KASUGA Yuzuru (JP)
Kasuga 讓 (JP)
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Claims: