Title:
SAMPLE ANALYSIS DEVICE AND SAMPLE ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2016/121266
Kind Code:
A1
Abstract:
Provided are a sample analysis device and sample analysis method that make it possible to carry out accurate measurement using a simple method. A sample analysis device (100) is provided with a chip (102) on which a plurality of measurement chambers (404) are formed on a first circle around an axis of rotation (450) and on which opening parts (407) communicating with the measurement chambers (404) are formed on a second circle around the axis of rotation (450), a liquid feeding mechanism (108) for feeding liquid to the measurement chambers (404) via the opening parts (407), and a measurement unit (109) for analyzing the components of the liquid on the basis of the transmitted light amount of light transmitted through the measurement chambers (404).
Inventors:
TSUNASAWA HIROSHI
NAKAMURA ATSUSHI
ADACHI YUSUKE
NAKAMURA ATSUSHI
ADACHI YUSUKE
Application Number:
PCT/JP2015/085695
Publication Date:
August 04, 2016
Filing Date:
December 21, 2015
Export Citation:
Assignee:
SHARP KK (JP)
International Classes:
G01N35/00; G01N21/27; G01N37/00
Domestic Patent References:
| WO2006011531A1 | 2006-02-02 |
Foreign References:
| JPS57156057A | 1982-09-27 | |||
| JP2001208761A | 2001-08-03 | |||
| JP2009128367A | 2009-06-11 | |||
| JP2011007778A | 2011-01-13 |
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (JP)
Patent business corporation HARAKENZO WORLD PATENT & TRADEMARK (JP)
Patent business corporation HARAKENZO WORLD PATENT & TRADEMARK (JP)
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