Title:
SAMPLE ANALYSIS METHOD AND SAMPLE INTRODUCTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/187408
Kind Code:
A1
Abstract:
After a sample solution is converted into a sample mist by a nebuliser (4), solvent is removed by heating with a solvent removal unit (7). A sample gas comprising the sample mist following solvent removal and a carrier gas is introduced to a plasma torch (30) via a sample introduction pipe (9). An addition part (10) adds a moisture-containing gas, which is the carrier gas including moisture, to the sample introduction pipe (9). The addition part (10) comprises: a container (11) into which ultra-pure water is introduced; a gas pipe (12) that introduces the carrier gas into the ultra-pure water and causes bubbling; and a gas pipe (14) that adds the moisture-containing gas generated by the bubbling to the sample introduction pipe (9). The plasma torch (30) generates an inductively-coupled plasma under the condition that the supply power is 550–700W. Accordingly, sample gas comprising the sample mist from which a solvent has been removed by heating and the carrier gas that conveys said mist is introduced into the plasma, and the formation generation of interfering molecular ions by elements having high ionisation potential is suppressed during an analysis of elements within the sample ionised by the plasma.
Inventors:
ARAKI KENJI (JP)
Application Number:
PCT/JP2018/046916
Publication Date:
October 03, 2019
Filing Date:
December 20, 2018
Export Citation:
Assignee:
SHINETSU HANDOTAI KK (JP)
International Classes:
G01N27/62; H01J49/04; H01J49/10; H05H1/30
Foreign References:
| JP2015190889A | 2015-11-02 | |||
| JPH10283980A | 1998-10-23 | |||
| JP2013156150A | 2013-08-15 | |||
| JP2014222178A | 2014-11-27 | |||
| JP2017015676A | 2017-01-19 | |||
| US9343283B1 | 2016-05-17 |
Attorney, Agent or Firm:
HARIKAWA, Takashi (JP)
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