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Title:
SAMPLE ANALYZER CLEANING CONTROL METHOD AND SAMPLE ANALYZER
Document Type and Number:
WIPO Patent Application WO/2019/061503
Kind Code:
A1
Abstract:
A sample analyzer cleaning control method comprises the following steps: obtaining current operation information of a current operation step and historical operation information of a target device required by the current operation step; obtaining, from a preset cleaning parameter table, a cross-contamination relationship between a historical operation step of the target device and the current operation step and corresponding preset cleaning operation information for removing the cross-contamination relationship, on the basis of the historical operation information of the target device and the current operation information of the current operation step; and if the cross-contamination relationship between the historical operation step of the target device and the current operation step has not been removed, cleaning the target device according to the preset cleaning operation information or cleaning the target device according to the historical operation information of the target device and preset operation information. The invention further provides a sample analyzer. The cleaning control method for the sample analyzer avoids cross-contamination, improves cleaning effects, and conserves resources by reducing consumption of a cleaning agent and water.

Inventors:
ZHANG XINGHUA (CN)
ZHOU YANG (CN)
Application Number:
PCT/CN2017/105047
Publication Date:
April 04, 2019
Filing Date:
September 30, 2017
Export Citation:
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Assignee:
SHENZHEN MINDRAY BIOMEDICAL ELECTRONICS CO LTD (CN)
International Classes:
B08B7/00
Foreign References:
CN1947227A2007-04-11
CN102348988A2012-02-08
CN204817325U2015-12-02
CN102430549A2012-05-02
CN104289466A2015-01-21
US20090112515A12009-04-30
JP2008175731A2008-07-31
Attorney, Agent or Firm:
ADVANCE CHINA IP LAW OFFICE (CN)
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