Title:
SAMPLE HEATING METHOD AND HEATING CONTROL DEVICE
Document Type and Number:
WIPO Patent Application WO/2012/086168
Kind Code:
A1
Abstract:
Provided is a sample heating method using a microchip, wherein said method employs a microchip comprising: a container section (70e) which is at least partially formed of an elastic member; and a passage (61b) for guiding a liquid sample to the container section (70e). After the liquid sample has been received in the container section (70e), the liquid sample is heated while pressure is applied to the inside of the container (70e).
Inventors:
ASOGAWA MINORU (JP)
HAGIWARA HISASHI (JP)
HAGIWARA HISASHI (JP)
Application Number:
PCT/JP2011/007064
Publication Date:
June 28, 2012
Filing Date:
December 19, 2011
Export Citation:
Assignee:
NEC CORP (JP)
ASOGAWA MINORU (JP)
HAGIWARA HISASHI (JP)
ASOGAWA MINORU (JP)
HAGIWARA HISASHI (JP)
International Classes:
G01N35/00; C12M1/00; C12Q1/68; G01N35/08; G01N37/00
Domestic Patent References:
WO2009038203A1 | 2009-03-26 | |||
WO2009038203A1 | 2009-03-26 |
Foreign References:
JP2007278789A | 2007-10-25 | |||
JP2007309868A | 2007-11-29 |
Other References:
See also references of EP 2657708A4
Attorney, Agent or Firm:
HAYAMI, SHINJI (JP)
Shinji Hayami (JP)
Shinji Hayami (JP)
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Claims: