Title:
SAMPLE IDENTIFICATION METHOD, DEVICE FOR IDENTIFYING SAMPLE, AND SAMPLE IDENTIFICATION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2020/138021
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide a sample identification method, a device for identifying a sample, and a sample identification apparatus that improve identification accuracy when a sample is identified using a device in which two or more through-holes through which the sample passes are formed in a substrate. The problem can be solved by a method, which identifies a sample (S1, S2) in a sample liquid, and comprises at least: a sample passing step of causing the sample to pass through a through-hole (3) formed in a substrate (2); an ion current measuring step of measuring a change in an ion current when the sample passes through the through-hole; and a sample identification step of identifying the sample in the sample liquid from the measured value of the ion current, wherein two or more through-holes are formed in the substrate, and the through-holes are arranged such that the distance between the adjacent through-holes is at least 200 nm or more.
Inventors:
TSUTSUI MAKUSU (JP)
ARIMA AKIHIDE (JP)
TANIGUCHI MASATERU (JP)
YOKOTA KAZUMICHI (JP)
KAWAI TOMOJI (JP)
ARIMA AKIHIDE (JP)
TANIGUCHI MASATERU (JP)
YOKOTA KAZUMICHI (JP)
KAWAI TOMOJI (JP)
Application Number:
PCT/JP2019/050469
Publication Date:
July 02, 2020
Filing Date:
December 24, 2019
Export Citation:
Assignee:
UNIV OSAKA (JP)
International Classes:
G01N27/00
Domestic Patent References:
| WO2018131064A1 | 2018-07-19 | |||
| WO2012165400A1 | 2012-12-06 |
Foreign References:
| US20180106746A1 | 2018-04-19 |
Attorney, Agent or Firm:
MATSUMOTO Seiji (JP)
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